Mahr, 6820426, Superfine Roughness Standard without Calibration Certificate
Roughness standards are used for calibrating the entire surface texture measuring instrument. They feature a known roughness, enabling verification of pick-up, amplifier, profile filters, profile evaluation and recording to be performed in a single measurement. Compared with sine-wave profile standards, these turned standards present a surface structure of waviness and roughness with different wavelengths phases and amplitudes. In the traverse direction the irregular profile recurs several times, so that similar profile traces are measured irrespective of the measurement's starting position. When traversing a roughness standard, the pick-up experiences nearly the same dynamics as for measuring a work-piece surface.
Surface texture parameters according to ISO 4278 (Ra, Rz…) as well as parameters as per ISO 13565 (Rk, Rpk, Rvk...) may be stated.
The standard is used for stylus instruments as well as for optical probes e.g. white light interferometers.